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TappingMode AFM

Basic TappingMode AFM Operation

Rev. D Dimension 3100 Manual 135

9.2.6 Focus Surface

1. Select Stage > Focus Surface or click the Focus Surface icon.

2. In the Focus On box, select Choose either surface or Tip reflection. If the sample is very

flat or reflective, choose Tip reflection.

3. Focus on the sample surface using the trackball with the bottom left button depressed.

Note: You may need to adjust the illumination and zoom to clearly see the probe.

9.2.7 Cantilever Tune

This section describes the steps required to ﬁnd the resonance peak of the cantilever and adjust the

oscillation voltage so the cantilever vibrates at an appropriate amplitude. A range of oscillation

frequencies are applied to the cantilever to determine the frequency which produces the largest

response (the resonant frequency). In most instances, the resonant peak has a sharp Gaussian

distribution but at times the peak can be ragged. The system tolerates some deviation in the shape of

the peak.

• Select View > Sweep > Cantilever Tune, or click on the Cantilever Tune icon.

The initial Cantilever Tune panel appears with the Frequency Sweep (a plot of

cantilever response as a function of applied oscillation frequency) on the display

monitor.

• Choose either the manual or automatic tuning method (see Automatic Tuning and

Manual Cantilever Tuning).

CAUTION: Use caution when focussing on the sample surface. Moving the

head too quickly while focussing can cause the tip to crash, which

may damage the tip and/or sample.

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